Solutions Overview
eInnoSys provides advanced Yield Improvement Solutions for Semiconductor Manufacturing designed to optimize production processes, reduce misprocessing, and improve product quality. Our yield improvement strategy combines automation, data correlation, and intelligent process control to deliver measurable manufacturing improvements.
Our Software Solutions for Yield Improvement
Add SECS/GEM automation capability on existing or legacy equipment using our patent-pending product EIGEMBox. This enables automation and process data collection from equipment that previously lacked communication capabilities.
Advanced Process Control (APC)
With decades of Fab and Assembly operations experience, eInnoSys has developed Advanced Process Control solutions that collect and analyze metrology data and automatically adjust process recipes and parameters to improve semiconductor yield.
Fault Detection & Classification(FDC)
eInnoSys has successfully implemented multiple Fault Detection & Classification projects across various fabs to identify process deviations and prevent yield losses.
Industry Challenges
Industry Challenges We Solve
Semiconductor manufacturing facilities often face yield-related challenges such as
- Misprocessing of wafers
- Limited visibility into process data
- Lack of automation in legacy equipment
- Difficulty correlating end-to-end wafer data
- Manual recipe selection errors
- Inconsistent process control
- Equipment alarm monitoring challenges
- Quality and yield losses
Solution Categories / Use Case Based Solutions
Yield Management Solutions
- Host applications or station controllers that download or select recipes using barcode or RFID scanning of lot boxes and remotely start processes
- Collection and analysis of alarms, events, and critical process parameters from equipment through SECS/GEM or other integration methods
- Correlation of equipment data with MES and other equipment data
- End-to-end wafer data correlation from epitaxial processes to final test
- Feedback and feed-forward metrology data integration to process equipment for yield improvement
Key Features Across Our Software Solutions
SECS/GEM Automation Integration
Metrology Data Collection & Analysis
End-to-End Wafer Data Correlation
Recipe Management Automation
Fault Detection & Classification Monitoring
Barcode & RFID Based Lot Tracking
Alarm & Event Monitoring
MES Integration Capabilities
Key Benefits of Yield Improvement
Improve Semiconductor Yield
Reduce process variability and misprocessing events.
Reduce Manufacturing Errors
Automate recipe selection and process control.
Enhance Process Visibility
Gain complete insight into equipment and wafer-level data.
Enable Legacy Equipment Automation
Add automation capability through EIGEMBox.
Reduce Operational Costs
Improve production efficiency and reduce waste.
Improve Quality & Reliability
Deliver consistent manufacturing performance.
Industries We Serve
Semiconductor Manufacturing
Wafer FABs
Assembly, Test & Packaging Facilities
Electronics Manufacturing
Our Core Expertise
Security & Compliance
- Role-based access control
- Secure equipment data communication
- Reliable alarm and event tracking
- Data logging and audit capability
- Industrial automation compliance support
Integration Capability
- MES Systems
- SECS/GEM Enabled Equipment
- Legacy Equipment through EIGEMBox
- Metrology Tools
- Factory Automation Platforms
Implementation & Deployment Process
Yield Analysis & Requirement Study
Solution Design & Architecture Development
Automation & Software Implementation
Integration with Equipment and MES
Testing & Validation
Deployment & Optimization
Ongoing Support & Enhancement
Technology & Expertise
EInnoSys provides deep semiconductor domain expertise
including
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SECS/GEM & Factory Automation Expertise
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Advanced Process Control Development
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Fault Detection & Classification Systems
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Yield Data Analytics & Correlation
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Smart Manufacturing Automation
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Semiconductor Yield Strategy Implementation
System Architecture / Technical Approach
Our Yield Improvement Solution architecture supports
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Data collection from equipment using SECS/GEM
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Integration with MES and manufacturing systems
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Metrology data analytics and correlation
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Automated process control and recipe optimization
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Feedback and feed-forward automation strategies
Support & Maintenance
EInnoSys provides complete lifecycle support including
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Technical Support
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Software Updates
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Performance Monitoring
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Automation Optimization
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Training & Documentation
Improve Semiconductor Yield with eInnoSys Automation Solutions
Enhance manufacturing efficiency, reduce yield losses, and optimize process control with advanced yield improvement technologies.
Case Studies
Real-Time Anomaly Detection for Automated Material Handling Systems
Deployment of the AOI computer vision overlay transformed OHT anomaly detection from a reactive, manually driven process into…
Improving yield at Honeywell’s
By enabling real-time monitoring and predictive maintenance, we reduced scrap, avoided costly upgrades, and transformed operations from reactive…
Help meeting on-time delivery targets at one of the largest OSAT in the world
Enabled on-time delivery at a leading OSAT by achieving full SECS/GEM compliance, doubling productivity, eliminating recipe errors, and…
Fast, Flexible & Reliable SECS/GEM, GEM300 & E84 Integration for metrology OEM
Achieved 300% faster data transfer with a fast, flexible, and reliable SECS/GEM, GEM300, and E84 integration—delivering improved performance,…
Why Choose eInnoSys
Decades of Semiconductor Manufacturing Experience
Proven Yield Improvement Strategy
Strong Automation & Data Analytics Expertise
Patent-Pending Automation Products
Custom Software & Integration Capabilities
Schedule a Free Technical Consultation
Connect with our experts to discuss your OEM and FAB/ATP requirements and explore the right solution for your operations.
Industry Insights
25
Apr
- By Nirav Thakkar
- Blog
7 Key Features of SECS GEM SDK You Should Know
Technical Guide for Equipment Engineers, Software Engineers & OEMs In modern semiconductor manufacturing, seamless equipment communication is critical…
Read More
25
Apr
- By Dan Wallace
- Blog
Choosing the Right OSAT Software Development Partner for Backend Automation Solutions
Introduction The semiconductor industry continues to evolve rapidly as manufacturers push toward higher efficiency, improved yield, and smarter…
Read More
25
Apr
- By mike.brown
- Blog
Top SECS GEM Integration Challenges (And Fixes)
Introduction In the semiconductor industry, SECS GEM Integration is the backbone of equipment-to-host communication. The SEMI Equipment Communication…
Read MoreFrequently Asked Questions (FAQ)
What is Semiconductor Yield Improvement?
Yield improvement in manufacturing focuses on optimizing production processes to reduce defects and improve output quality.
Can Yield Improvement Solutions Work with Legacy Equipment?
Yes, EIGEMBox enables automation and data collection from legacy semiconductor equipment.
Do You Support End-to-End Wafer Data Analysis?
Yes, eInnoSys solutions correlate wafer data from epitaxial processing to final testing.
Do Your Solutions Integrate with MES?
Yes, our solutions support MES and factory automation system integration.