Introducing EI-AOI, the cutting-edge solution for automated visual inspection that sets a new standard in precision and efficiency. Our revolutionary software, powered by advanced industrial cameras, transforms the monitoring of various meters, including gas flow meters, chemical meters, and all type of analog meters, across industrial sectors.
We provide a turnkey solution with required hardware such as camera, mounting and required software.
From detecting macro-defects on wafers/PCBs to identifying dust, debris, scratches, on robotic hands, our software caters to diverse inspection needs with precision and efficiency.
Experience the future of industrial monitoring with EI-AOI, where automated visual inspection meets innovation, enabling industries to enhance productivity, minimize errors, and ensure operational excellence. Say hello to a smarter, more efficient approach to visual inspection with EI-AOI.
Real-time readings, as frequent as every second, can be transmitted to the customer's preferred system (FDC, SCADA, MES, etc.) in either SECS/GEM or OPC-UA format.
Applications
Wafer Anomaly Detection
Dust/Debris Detection
PCB Defect Detection
Gauge Reading
Features Of EI-AOI
Real-Time Screening
Instantly monitor pressure gauge readings with real-time data capture
Reduces Man Power
Streamline operations by minimizing the need for manual reading and inspection
Data Gathering and Analysis
EI-AOI facilitates efficient data collection and analysis, aiding in decision-making processes
Cost-Effective
Save on labor costs and minimize errors with our automated optical inspection solution
Saves Time
Increase efficiency and productivity by eliminating the need for manual gauge readings
Efficient and Reliable
Utilize computer vision technology to ensure accurate and reliable interpretation of gauge readings
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FAQs of EI-AOI
Q1: What is EI-AOI?
A1: EI-AOI is an automated optical inspection solution designed for the semiconductor industry, providing precise and efficient defect detection.
Q2: How does EI-AOI improve quality control?
A2: EI-AOI uses advanced imaging and AI algorithms to detect defects accurately, ensuring higher product quality and yield.
Q3: What are the key features of EI-AOI?
A3: Key features include high-resolution imaging, real-time defect detection, and integration with SECS/GEM systems.
Q4: Is EI-AOI compatible with my current inspection processes?
A4: EI-AOI is designed to integrate seamlessly with existing inspection processes and equipment in semiconductor manufacturing.
Q5: How do I implement EI-AOI in my production line?
A5: Install EI-AOI according to the provided guide, configure the system settings, and connect it to your inspection equipment and MES.